FISCHERSCOPE X-RAY 5000
Features
Applications
The automated XRF system for photovoltaics
The FISCHERSCOPE® X-RAY 5000 system continuously measures the layer thickness of thin layers on large-area substrates, for example in photovoltaics. The devices in this series form modular units that are easy to install in production lines. The X-RAY 5000 can be operated either in normal atmosphere or under vacuum. Furthermore, the XRF device is designed to be easy to maintain: the measuring head can be serviced without having to release the vacuum.
If the product moves or bulges during fabrication, it can skew the measuring results. For this reason, Fischer’s WinFTM software also has a built-in function for distance compensation, which can compensate for fluctuations of up to 1 cm without requiring additional distance sensors.
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