FISCHER TECHNOLOGY INC.

X-RAY XRF FLUORESCENCE

X-RAY XRF FLUORESCENCE

FISCHERSCOPE X-RAY XRF

Benefits

• Engineered in Germany: Best quality and cutting-edge technology
• Just one software for XRF coating thickness measurement and material analysis
• Extended statistic functions; for example, measurement results can be logged and reported as SPC charts
• Image recognition: WinFTM finds pre-set measurement positions on its own
• Standard free measurements based of fundamental parameter analysis: achieve accurate XRF measurement results without knowing the composition of a sample at hand
• Distance Controlled Measurement (DCM): no need to move an axis for keeping the right measuring distance to an irregularly shaped sample; just focus the camera to the sample's surface – WinFTM does the rest; this is faster than moving an axis; additionally, there is no risk of the axis colliding with the sample
• Measurement quality: our XRF instuments can judge the quality of your measurements; mistakenly selected the wrong measuring task or measured in the wrong sample? Your FISCHERSCOPE XRF gauge will alert you
• Tasks: almost any sequences performed in the WinFTM software can be programmed and launched with just one click; for example, a task can measure multiple alloy samples automatically; the XRF spectrometer moves the XY-table to the sample postions, loads for each alloy specific measurement conditions and finally prepares a report according to your needs