JEOL

JEOL

Leuvensesteenweg 542, Zaventem, Flanders, 1930

Gatan Dimple Grinder II Model657

Gatan Dimple Grinder II Model657

It is a device that polishes the central part of the sample for an electron microscope to a thickness of about 5 to 10 μm. By this process, it is possible to efficiently prepare a thin film sample by ion milling after that.

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