JEOL

The JED-2300 Analysis Station Plus

Total design

JED-2300 Analysis Station Plus has a total design unique to the same manufacturer of SEM / FIB and EDS, with the concept of "seamlessly from observation to analysis". Since electron microscope images and analysis data can be stored in the same folder and displayed as an "analysis data list", various data such as spectra can be managed collectively in an easy-to-understand manner. In addition, with the SEM / FIB equipped with a motor-driven stage, it is possible to visually grasp the electron microscope images of different magnifications and stage positions, and the arrangement of element maps, and it is easy to manage data over a wide area.

Operation icon

The icons are arranged from the left according to the operation procedure. In addition, Japanese is displayed so that the functions can be understood at a glance.

Index image

You can intuitively find the acquired data from the index image.

Analysis data list

The electron microscope image of the analysis field and the analysis data are automatically associated and saved in the same folder. When you select a field of view in the index image, the data associated with the field of view is displayed in the analysis data list, which facilitates data management.